KIOXIA FYU6_1T 218L 1 Tb TLC 3D NAND Floorplan Analysis

KIOXIA FYU6_1T 218L 1 Tb TLC 3D NAND Floorplan Analysis

Discover key insights from this Memory Floorplan Analysis of the KIOXIA/WDC FYU6_1T die, showcasing advancements in 3D NAND technology and performance improvements. Read the full report for more details.

This report presents a Memory Floorplan Analysis of the KIOXIA/WDC FYU6_1T die found inside KIOXIA TH58LKT3Y48BA8J NAND flash package. Within the TH58LKT3Y48BA8J NAND flash package, the NAND dies are shingle-stacked in two side-by-side stacks of four and are connected to the printed wiring board (PWB) via bonding wires.

The KIOXIA/WDC FYU6_1T die comprises of 1,024 Gb 3D NAND flash memory. The 218-layer 3D NAND has an impressive interface speed of 3.6 giga-bits per second (Gbps), 20% write performance improvement, more than 10% read latency improvement, 50% higher bit density, and 30% power efficiency improvement over than previous generation of 162-layer 3D NAND. More information on NAND memory devices and trends can be found in the Memory NAND Technology Roadmap. The information contained in this report is relevant to:

  • Chip Material and Capital Equipment Supplier
  • Chip Fabrication
  • Chip Designs
View the Analysis

This summary outlines the analysis found on the TechInsights' Platform.

Enter your email to register to the TechInsights Platform and access the full analysis summary, as well as the report.
 

Already a TechInsights Platform User?

View the Analysis

The authoritative information platform to the semiconductor industry.

Discover why TechInsights stands as the semiconductor industry's most trusted source for actionable, in-depth intelligence.