This report presents an internal waveform analysis on the Cypress Semiconductor (Spansion) S25FS512SDSBHV213 NOR flash memory. This device is a 512 Mbit non-volatile flash, 1.8 volts, serial peripheral interface (SPI) multi-I/O. The following report contains a set of the acquired waveforms and annotated photographs divided into the following sections:
- Architectural Overview
- Waveform Analysis
- Schematics
- Test Procedure
- Major Findings
- Standard Cells